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Material characterizations

►Know-how

The Nano-Rennes platform has a set of equipments that allows us to perform structural characterizations.

 

►Description of the structural characterisation equipments

 

Schéma banc à double diffraction X

Double X diffraction bench

  • Measurement of a mesh parameter (0.1 %)
  • Measurement of the thickness (0.1 nm)

AFM Di-Innova

2 AFMs VEECO DI Innova (FOTON-INSA and IETR-GM)

  • Modes : contact, tapping, EFM, nano-oxydation (Si only)
  • Samples <1/4 2 inches
  • Scanner 5 and 100 µm

 

►Examples of achievements

 

Caractérisation DDX d'un super-réseau
Superlattice DDX characterization
Image AFM (Tapping mode) de marches atomiques InP/GaP
AFM (Tapping phase) image of nanostructured InP surface
Image AFM (Tapping phase) d'une surface d'InP nanostructurée
AFM (Tapping phase) image of nanostructured InP surface

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